Thursday, March 16, 2006
8:00AM - 8:12AM
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U9.00001: An \textit{in-situ} Study of Martensitic Transformation in Shape Memory Alloys using PEEM
Gang Xiong, T. Droubay, A. Joly, W. Hess, M. Cai, S. Langford, J. Dickinson, M. Wu, Q. He, W. Huang
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Thursday, March 16, 2006
8:12AM - 8:24AM
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U9.00002: Investigation of ferroelectric materials with scanning microwave microscope
Jewook Park, Jonghoon Cho, Sangyun Lee, Kookrin Char
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Thursday, March 16, 2006
8:24AM - 8:36AM
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U9.00003: Plasmon-based Enhanced NSOM Spectroscopy.
A.T. Chang, C.L. Nehl, F. Tam, N.J. Halas, J.H. Hafner, K.F. Kelly
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Thursday, March 16, 2006
8:36AM - 8:48AM
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U9.00004: Dielectrophoretic Force Microscopy
Al Hilton, Brian Lynch, Garth Simpson
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Thursday, March 16, 2006
8:48AM - 9:00AM
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U9.00005: Spectral density of fluctuations for a driven, nonlinear micromechanical oscillator at kinetic phase transition
Corey Stambaugh, Ho Bun Chan
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Thursday, March 16, 2006
9:00AM - 9:12AM
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U9.00006: Nonlinear coupling of nano mechanical resonators to Josephson quantum circuits
Xingxiang Zhou, Ari Mizel
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Thursday, March 16, 2006
9:12AM - 9:24AM
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U9.00007: Nanomanipulation with dynamic AFM
Ivan Stich, Peter Dieska, Ruben Perez
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Thursday, March 16, 2006
9:24AM - 9:36AM
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U9.00008: Assembly of Nanoparticle-Attached AFM Tips for Nano-Optical Applications
Taekyeong Kim, Sung Myung, Narae Cho, Seunghun Hong
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Thursday, March 16, 2006
9:36AM - 9:48AM
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U9.00009: Investigation of Electrical Behaviors of Nanostructures through Scanning-Probe Microscopy
Beverly Clark III, Hans Hallen
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Thursday, March 16, 2006
9:48AM - 10:00AM
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U9.00010: Scanning Tunneling Potentiometry for Nanoscale Transport Studies
Michael Rozler, M.R. Beasley
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Thursday, March 16, 2006
10:00AM - 10:12AM
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U9.00011: Alpha Control - A new Concept in SPM Control \newline
P. Spizig, D. Sanchen, G. Volswinkler, W. Ibach, J. Koenen
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Thursday, March 16, 2006
10:12AM - 10:24AM
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U9.00012: Theory of Q-Controlled Dynamic Force Microscopy in Liquids
Hendrik Holscher, Udo D. Schwarz
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Thursday, March 16, 2006
10:24AM - 10:36AM
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U9.00013: Simulation of contact and non-contact AFM images of H-terminated Si(100) surface with a CH3 impurity
Akira Masago, Satoshi Watanabe, Katsunori Tagami, Masaru Tsukada
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