2006 APS March Meeting
Monday–Friday, March 13–17, 2006;
Baltimore, MD
Session R33: Focus Session: Friction, Fracture and Deformation IV
2:30 PM–4:54 PM,
Wednesday, March 15, 2006
Baltimore Convention Center
Room: 336
Sponsoring
Units:
DMP GSNP
Chair: Stefan Koehler, Emory University
Abstract ID: BAPS.2006.MAR.R33.1
Abstract: R33.00001 : Scanning Probe Applications to the Adhesive, Tribological and Rheological Properties of Materials
2:30 PM–3:06 PM
Preview Abstract
Abstract
Author:
Jack E. Houston
(Sandia National Laboratories)
Scanning probes are finding expanding application to the local
analysis of a
broad range of materials properties. I will discuss studies of
adhesion,
tribology and rheology applied to a range of materials using
Interfacial
Force Microscopy (IFM), a scanning force-probe technique
distinguished by
its use of a quantitative and mechanically stable force-feedback
sensor.
This unique sensor enables the force to be recorded as two
interfaces
approach, make contact, deform and separate making possible an
accurate
evaluation of the development of the adhesive bond and its
failure. Thus,
the nature of the adhesive bond, e.g., van der Waals, electrostatic,
covalent, etc., can be established and the total adhesive energy
measured
quantitatively. Lateral forces can also be measured enabling direct
observation of the interfacial friction force as a function of
the normal
force. These advantages will be illustrated with examples
involving: (1) the
interaction of a tip and substrate functionalized with
self-assembled
monolayer films having various combinations of chemically
distinct end
groups, as well as the interaction involving polymer surfaces,
(2) the
viscous properties of adventitious water adsorbed on various tip and
substrate materials and (3) a quantitative, local rheological
analysis of an
extreme example of a viscoelastic material. These examples clearly
demonstrate the intimate relationship between interfacial bond
strength and
the mechanical properties of the contact in determining overall
adhesive
strength. In addition, they dramatically demonstrate the weak
correlation
between the maximum adhesive force upon contact separation (the
so called
``pull-off force'') and the quantitative work of adhesion. The
assumptions
required to make this correlation strong are seldom valid in
``real''
contact situations. Sandia is a multi-program laboratory operated
by Sandia
Corporation, a Lockheed Martin Company, for the U.S. Department
of Energy's
National Nuclear Security Administration under Contract
DE-AC04-94AL85000.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.R33.1