Wednesday, March 15, 2006
2:30PM - 2:42PM
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R17.00001: Dependence of the groundstate interband optical transition in InAs-GaSb superlattices on the width of the GaSb layers
Patrick Folkes, J. Little, S. Svensson, K. Olver, A. Amtout, S. Krishna
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Wednesday, March 15, 2006
2:42PM - 2:54PM
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R17.00002: Comparison of terahertz emission from N-face and In-face indium nitride thin films
Grace Chern, Eric Readinger, Hongen Shen, Michael Wraback, Chad Gallinat, Gregor Koblmueller, James Speck
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Wednesday, March 15, 2006
2:54PM - 3:06PM
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R17.00003: Electro-Optical characterization of W-structured type-II superlattice photodetectors
J.G. Tischler, E.H. Aifer, I. Vurgaftman, J.R. Meyer, C.L. Canedy, E.M. Jackson
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Wednesday, March 15, 2006
3:06PM - 3:42PM
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R17.00004: Recent development of terahertz wave sensing and imaging science, technology, and applications
Invited Speaker:
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Wednesday, March 15, 2006
3:42PM - 3:54PM
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R17.00005: Self-assembled ErAs nanoislands for enhanced terahertz detection.
John O'Hara, Rohit Prasankumar, Josh Zide, Art Gossard, Antoinette Taylor, Richard Averitt
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Wednesday, March 15, 2006
3:54PM - 4:06PM
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R17.00006: Type II superlattice infrared focal plane arrays: Optical, electrical, and mid-wave infrared imaging characterization.
John Little, Stefan Svensson, Arnie Goldberg, Steve Kennerly, Kim Olver, Trirat Hongsmatip, Michael Winn, Parvez Uppal
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Wednesday, March 15, 2006
4:06PM - 4:18PM
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R17.00007: Pulsed THz-emission and carrier concentrations in InN
Ricardo Ascazubi, Ingrid Wilke, William Schaff
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Wednesday, March 15, 2006
4:18PM - 4:30PM
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R17.00008: A New All-Optical Imaging Scheme based on QWIP technology
Debing Zeng, Gang Chen, Rainer Martini
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Wednesday, March 15, 2006
4:30PM - 4:42PM
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R17.00009: A THz Microcavity with a Phononic Cavity Polariton
Hadley Lawler, Sanjiv Shresta, Gavin Brennen
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Wednesday, March 15, 2006
4:42PM - 4:54PM
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R17.00010: Interplay between plasmon and current due to terahertz radiation
Danhong Huang, Casey Rhodes, Paul Alsing, Dave Cardimona
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Wednesday, March 15, 2006
4:54PM - 5:06PM
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R17.00011: Submicron Material Characterization Using Terahertz Scanning Near-Field Microscopy
Hou-Tong Chen, Antoinette Taylor, Richard Averitt, Federico Buersgens, Roland Kersting
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