Bulletin of the American Physical Society
2006 APS March Meeting
Monday–Friday, March 13–17, 2006; Baltimore, MD
Session Q1: Poster Session III
1:00 PM,
Wednesday, March 15, 2006
Baltimore Convention Center
Room: Exhibit Hall, 1:00pm - 4:00pm (DPOLY session: 11:15am - 2:15pm)
Abstract ID: BAPS.2006.MAR.Q1.101
Abstract: Q1.00101 : Near Field Measurement of Broad Area Laser Diodes by Utilizing Near-Field Scanning Microscope
Preview Abstract Abstract
Authors:
Soon Il Jeong
Joo In Lee
(Korea Research Institute of Standards and Science )
Il Ki Han
Youngchai Yoo
Kyoung Chan Kim
Jin Dong Song
Won Jun Choi
Won Jo Cho
Jung Il Lee
(Korea Institute of Science and Technology)
Si Hyung Cho
(Potomac Optronics)
Mario Dagenais
(University of Maryland)
Collaborations:
Nanosurface Group, Nano Device Research Center, Potomac Optronics, Electrical \& Computer Engineering
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.Q1.101
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