2006 APS March Meeting
Monday–Friday, March 13–17, 2006;
Baltimore, MD
Session P4: Keithley Award Session
11:15 AM–1:39 PM,
Wednesday, March 15, 2006
Baltimore Convention Center
Room: 308
Sponsoring
Unit:
GIMS
Abstract ID: BAPS.2006.MAR.P4.1
Abstract: P4.00001 : Nanocalorimetry: Using Si-micromachined Devices for Thermodynamic Measurements of Thin Films and Tiny Crystals*
11:15 AM–11:51 AM
Preview Abstract
Abstract
Author:
Frances Hellman
(Physics Dept., University of California, Berkeley, and Materials Sciences Division, Lawrence Berkeley Lab)
We have used Si
micromachining to fabricate membrane-based calorimeters for
measuring
thermodynamic properties of microgram-quantity samples over a
temperature
range from 1.7 to 550K in magnetic fields to 8T. Prototype scaled
down
devices have been made which allow precise measurements of nanogram
quantities. Different types of thermometers are used for
different purposes
and in different temperature ranges. Current development efforts are
extending the temperature range to 0.3 - 800K, and we are
collaborating with
the national high magnetic field lab to extend the field range to
65T in
pulsed magnets. These devices are particularly useful for
specific heat
measurements of thin film samples (100-400 nm thick) deposited
directly onto
the membrane through a Si micromachined evaporation mask. They
have also
been used for small bulk samples attached by conducting paint or
In, and for
powder samples dissolved in a solvent and dropped onto devices. The
measurement technique used (relaxation method) is particularly
suited to
high fields because thermal conductance is measured in zero field
and is
field independent, while the relaxation time constant does not
depend on
thermometer calibration. The devices have been used with little
modification
for thermal conductivity and thermopower measurements, and are
well suited
to measurements of calorimetric signals such as those occurring
at phase
transitions or under irreversible thermal behavior. I will
discuss device
fabrication and thermal analysis which allow us to precisely
identify heat
flow in the devices and consequent limits on the absolute
accuracy, as well
as possible future directions for device development. I will also
briefly
discuss examples of measurements on several materials of current
interest:
1) amorphous Si and its alloys, 2) high precision critical
temperature
studies of La$_{1-x}$Sr$_{x}$MnO$_{3}$ and
La$_{1-x}$Ca$_{x}$MnO$_{3}$, 3)
antiferromagnetic CoO nanoparticles and thin layers, 4) Fe/Cr giant
magnetoresistance multilayers.
*I would like to thank the DOE and NSF for support
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.MAR.P4.1