2005 APS March Meeting
Monday–Friday, March 21–25, 2005;
Los Angeles, CA
Session Index
Session V14: Focus Session: Electronic and Atomic Structure of Interfaces and Gate Stacks I
|
Show Abstracts |
Sponsoring Units: FIAP
Chair: Alex Demkov, University of Texas-Austin
Room: LACC 403B
|
|
Thursday, March 24, 2005
11:15AM - 11:51AM
|
|
V14.00001: Current Schottky Barrier Concepts
Invited Speaker:
Preview Abstract |
Thursday, March 24, 2005
11:51AM - 12:03PM
|
|
V14.00002: Interface band alignment in high-k gate stacks
Bersch Eric, P. Hartlieb, S. Sayan, R. Bartynski, E. Garfunkel
Preview Abstract |
Thursday, March 24, 2005
12:03PM - 12:15PM
|
|
V14.00003: Surface States and rectification at a Metal high-k Dielectric Contact
Alex Demkov
Preview Abstract |
Thursday, March 24, 2005
12:15PM - 12:51PM
|
|
V14.00004: Metal screening for CMOS application through vacuum and interface work function ab-initio calculations: benefits and limitations
Invited Speaker:
Preview Abstract |
Thursday, March 24, 2005
12:51PM - 1:03PM
|
|
V14.00005: Properties of interfaces between metals and binary oxides.
Matias Nunez, Marco Buongiorno Nardelli
Preview Abstract |
Thursday, March 24, 2005
1:03PM - 1:15PM
|
|
V14.00006: Bloch States of the Interface Phase
Curt Billman, Fred Walker, Marco Buongiorno-Nardelli, Rodney McKee
Preview Abstract |
Thursday, March 24, 2005
1:15PM - 1:51PM
|
|
V14.00007: Intrinsic limitations for gate stack applications of complex high-k oxides in advanced Si devices: band edge states
Invited Speaker:
Preview Abstract |
Thursday, March 24, 2005
1:51PM - 2:03PM
|
|
V14.00008: Optical properties and metrology of the high-k/Si interface
Stefan Zollner, Yong Liang, David Theodore, Z. Yu, Dina Triyoso, Jay Curless, Clarence Tracy
Preview Abstract |
Thursday, March 24, 2005
2:03PM - 2:15PM
|
|
V14.00009: Enhanced permittivity of the interfacial oxide in gate insulator stacks on silicon
Alfredo Pasquarello, Feliciano Giustino
Preview Abstract |
