Bulletin of the American Physical Society
75th Annual Gaseous Electronics Conference
Volume 67, Number 9
Monday–Friday, October 3–7, 2022;
Sendai International Center, Sendai, Japan
The session times in this program are intended for Japan Standard Time zone in Tokyo, Japan (GMT+9)
Session HW6: Poster Session II (4:30-6:30pm, JST)
4:30 PM,
Wednesday, October 5, 2022
Sendai International Center
Room: Sakura 1
Abstract: HW6.00072 : Effect of Mixture Ratio of Ar Gas and C2H2 Gas on Gas-Injection Pulsed Plasma CVD Method for Ultra-High-Rate DLC Deposition*
Presenter:
Hikaru Ohhra
(Toyohashi University of Technology)
Authors:
Hikaru Ohhra
(Toyohashi University of Technology)
Naoto Nagata
(Toyohashi University of Technology)
Takahiro Bando
(Toyohashi University of Technology)
Hirofumi Takikawa
(Toyohashi University of Technology)
Toru Harigai
(Toyohashi University of Technology)
Shinsuke Kunitsugu
(Industrial Technology Center of Okayama Prefecture)
Hidenobu Gonda
(OSG Coating Servise CO., Ltd.)
DLC films were formed on a Si substrate using the gas-injection pulsed plasma CVD method. Ar and C2H2 mixed gas was injected into a chamber. A pulsed voltage of -500 V was applied to a substrate stage as a discharge electrode.
The DLC film deposition rate was the fastest in approximately 0.4–0.6 of the ratio of the Ar flow rate to the C2H2 flow rate and improved with the increase of the total gas flow rate. It is considered that the relationship between the Ar-gas-flow-rate ratio and the DLC film deposition rate depended on the effects of the C2H2 decomposition and the sputtering to the film with Ar ion collision. A DLC film with a nanoindentation hardness of 18 GPa was formed at a deposition rate of 2.8 μm/min under the condition of an Ar ratio of 0.71 and a total gas flow rate of 1750 sccm.
*This work was supported by Osawa Scientific Studies Grands Foundation.
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