Bulletin of the American Physical Society
75th Annual Gaseous Electronics Conference
Volume 67, Number 9
Monday–Friday, October 3–7, 2022;
Sendai International Center, Sendai, Japan
The session times in this program are intended for Japan Standard Time zone in Tokyo, Japan (GMT+9)
Session DF2: Laser Diagnostics II
10:00 AM–12:00 PM,
Friday, October 7, 2022
Sendai International Center
Room: Tachibana
Chair: Uwe Czarnetzki, Ruhr University Bochum, Germany
Abstract: DF2.00003 : Plasma sheath diagnostic using microscpic particle probes manipulated in laser tweezers
10:30 AM–11:00 AM
Presenter:
Holger Kersten
(U Kiel, IEAP, PlasmaTechnology)
Authors:
Holger Kersten
(U Kiel, IEAP, PlasmaTechnology)
Jessica Schleitzer
(U Kiel, IEAP, PlasmaTechnology)
Viktor Schneider
(U Kiel, IEAP, PlasmaTechnology)
The presentation first gives a brief overview of some experiments in which microparticles were used as probes. For example, experiments on the momentum of test particles showed the importance of fast neutrals in an ion beam by charge exchange collisions [3]. With the help of temperature-dependent fluorescent particles, the temperature of the particles and, via modeling, the energy balance due to the surrounding plasma could be estimated [4]. Recently published studies with optically trapped microparticles [5, 6] showed for the first time the forces acting on the particles within the whole sheath of an rf plasma down to the electrode surface. Assuming a linear field increase in this space charge region, it is possible to estimate the spatial development of the particle charge from the bulk towards the electrode.
[1] Benedikt, J., et.al., Plasma Sources Sci. Technol. 30(2021), 033001.
[2] Maurer, H.R., et.al., Contrib. Plasma Phys. 51(2011), 218-227.
[3] Schneider, V., et.al., Rev. Sci. Instrum. 81(2010), 013503.
[4] Maurer, H.R., et.al., Phys. Plasmas 17(2010), 113707.
[5] Schneider, V., et.al., Rev. Sci. Instrum. 89(2018), 103505.
[6] Schleitzer, J., et.al., Phys. Plasmas 28(2021), 083506.
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