Bulletin of the American Physical Society
63rd Annual Gaseous Electronics Conference and 7th International Conference on Reactive Plasmas
Volume 55, Number 7
Monday–Friday, October 4–8, 2010; Paris, France
Session DTP: Poster Session II (14:00-15:30)
2:00 PM,
Tuesday, October 5, 2010
Room: 8 and 251
Abstract ID: BAPS.2010.GEC.DTP.176
Abstract: DTP.00176 : Electron density measurements in technological plasmas using the Multipole Resonance Probe
Preview Abstract Abstract
Authors:
T. Styrnoll
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
M. Lapke
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
C. Schulz
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
R. Storch
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
J. Oberath
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
T. Musch
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
I. Rolfes
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
P. Awakowicz
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
T. Mussenbrock
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
R.P. Brinkmann
(Department of Electrical Engineering and Information Sciences, Ruhr-University Bochum, Germany)
Collaboration:
RUB MRP
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2010.GEC.DTP.176
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