2006 59th Annual Gaseous Electronics Conference
Tuesday–Friday, October 10–13, 2006;
Columbus, Ohio
Session SRP1: Poster IIA
4:00 PM,
Thursday, October 12, 2006
Holiday Inn
Room: Salon A, 4:00pm - 5:30pm
Abstract ID: BAPS.2006.GEC.SRP1.2
Abstract: SRP1.00002 : Real time closed loop control of an Ar and Ar/O$_2$ plasma in an ICP
Preview Abstract
Abstract
Authors:
R. Faulkner
F. Sober\'on
A. McCarter
D. Gahan
S. Karkari
V. Milosavljevic
C. Hayden
A. Islyaikin
V.J. Law
M.B. Hopkins
(Dublin City University, Ireland)
B. Keville
P. Iordanov
S. Doherty
J.V. Ringwood
(National University of Ireland, Maynooth)
Real time closed loop control for plasma assisted semiconductor
manufacturing has been the subject of academic research for over a
decade. However, due to process complexity and the lack of
suitable real
time metrology, progress has been elusive and genuine real time,
multi-input, multi-output (MIMO) control of a plasma assisted process
has yet to be successfully implemented in an industrial setting.
A ~Splasma parameter control strategy~T is required to be adopted
whereby
process recipes which are defined in terms of plasma properties
such as
critical species densities as opposed to input variables such as rf
power and gas flow rates may be transferable between different
chamber
types.
While PIC simulations and multidimensional fluid models have
contributed
considerably to the basic understanding of plasmas and the design of
process equipment, such models require a large amount of
processing time
and are hence unsuitable for testing control algorithms. In contrast,
linear dynamical empirical models, obtained through system
identification techniques are ideal in some respects for control
design
since their computational requirements are comparatively small
and their
structure facilitates the application of classical control design
techniques. However, such models provide little process insight
and are
specific to an operating point of a particular machine.
An ideal first principles-based, control-oriented model would exhibit
the simplicity and computational requirements of an empirical
model and,
in addition, despite sacrificing first principles detail, capture
enough
of the essential physics and chemistry of the process in order to
provide reasonably accurate qualitative predictions.
This paper will discuss the development of such a first-principles
based, control-oriented model of a laboratory inductively coupled
plasma
chamber. The model consists of a global model of the chemical
kinetics
coupled to an analytical model of power deposition. Dynamics of
actuators including mass flow controllers and exhaust throttle are
included and sensor characteristics are also modelled. The
application
of this control-oriented model to achieve multivariable closed loop
control of specific species e.g. atomic Oxygen and ion density
using the
actuators rf power, Oxygen and Argon flow rates, and pressure/exhaust
flow rate in an Ar/O$_2$ ICP plasma will be presented.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.GEC.SRP1.2