Characterization of plasma experiments with interferometry diagnostics and the Talbot Numerical Tool*

The advent of high-intensity ultra-fast laser facilities, mid-scale pulsed-power systems, and X-ray Free Electron Lasers (XFEL) have enabled the development of intense x-ray and particle sources, warm dense matter, and high energy density plasmas. To study these new and extreme physics regimes, the development of accurate diagnostics is fundamental. X-ray imaging is a powerful tool enabling immediate assessment of experiments and valuable characterization data in post-processing. Talbot X-ray Interferometry is a versatile electron density, atomic composition, and small-angle x-ray scatter diagnostic. In the deflectometry mode, Talbot provides a wealth of information from a single image, retrieving high-resolution x-ray attenuation, phase, and dark-field maps simultaneously with the development of a dedicated Talbot Numerical Tool (TNT) for post-processing using novel data analysis algorithms. We present Talbot X-ray characterization of a wide range of plasma experiments in high-intensity laser, pulsed power, and XFEL systems as well as laser interferometry data analysis with TNT, demonstrating additional plasma characterization capabilities.