Bulletin of the American Physical Society
65th Annual Meeting of the APS Division of Plasma Physics
Monday–Friday, October 30–November 3 2023; Denver, Colorado
Session PP11: Poster Session VI:
MFE:DIII-D and conventional tokamaks II;MHD and stability; Analytic techniques in MFE;
ICF: Pinches and hohlraum physics
SPACE: Astrophysical plasmas
LTP:Low temperature plasma applications
MC:Miniconference: Shocks
2:00 PM - 5:00 PM
Wednesday, November 1, 2023
Room: Plaza ABC
Abstract: PP11.00040 : Prediction of kinetic profiles of D-T plasma using the TGYRO transport code in the JET DTE2 discharges
Presenter:
Nan Shi
(General Atomics)
Authors:
Nan Shi
(General Atomics)
Gary M Staebler
(Oak Ridge National Laboratory)
Emily A Belli
(General Atomics)
Joseph T McClenaghan
(General Atomics - San Diego)
Hyun-Tae Kim
(United Kingdom Atomic Energy Authority, CCFE, Culham Science Centre)
Fulvio Auriemma
(Consorzio RFX)
Krassimir Kirov
(United Kingdom Atomic Energy Authority, CCFE, Culham Science Centre)
An integrated modeling workflow TGYRO-STEP that iterates between the core transport with TGYRO, the pedestal pressure predicted with EPED and the MHD equilibrium computed with EFIT to find a self-consistent steady state solution is also reported. Comparing the STEP result with the fixed boundary runs shows how well the integrated modeling can predict the discharge without taking boundary conditions from the data.
This work was supported by the U.S. Department of Energy under DE-SC0019736 and DE-FG02-95ER54309.
[1] G.M. Staebler, et al., Nucl. Fusion 61 (2021) 116007
Disclaimer: This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.
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