Determination of the Thickness of the Back Dead-Layer of GRETINA Crystals via Comparisons of Measured Photopeak Efficiencies with GEANT4 Simulations*

Measurements of the photopeak efficiency of the GRETINA array up to 3.5 MeV made at the National Superconducting Cyclotron Laboratory with 152Eu and 56Co sources were compared with GEANT 4 simulations. We developed a method of determining the average thickness of the back dead layers of the GRETINA crystals by considering the partial photopeak efficiencies of events including gamma-ray interactions in the back slice of the crystals. The impact of dead-layer thicknesses on the accuracy of simulated photopeak efficiencies and the ratio of photopeak counts measured in the two GRETINA crystal types is discussed.