Bulletin of the American Physical Society
55th Annual Meeting of the APS Division of Atomic, Molecular and Optical Physics
Monday–Friday, June 3–7, 2024; Fort Worth, Texas
Session K00: Poster Session II (4pm-6pm CDT)
4:00 PM,
Wednesday, June 5, 2024
Room: Hall BC
Abstract: K00.00016 : Identification of highly charged Zr and Mo EUV spectral lines in an electron beam ion trap*
Presenter:
David Salgado
(Appalachian State University)
Authors:
David Salgado
(Appalachian State University)
Jessica Gerac
(Appalachian State University)
Leiyla S Brent
(Loyola University Maryland)
Hunter W Staiger
(Clemson University)
Yuri Ralchenko
(National Institute of Standards and Technology)
Endre Takacs
(Clemson University)
Roshani Silwal
(Appalachian State University)
confined in the electron beam ion trap (EBIT) at the National Institute of Standards
and Technology were measured [1]. The EUV emissions were recorded with a flat-
field grazing-incidence extreme-ultraviolet spectrometer [2] in the wavelength
range of 2 nm to 20 nm. The electron beam energy was systematically varied
between 2.5 keV and 11.8 keV to selectively create different ionization stages. Line
identification was aided by a detailed collisional-radiative modelling code NOMAD
that simulated the non-Maxwellian EBIT plasma. Many new lines from Li-like to
Ne-like ions were identified that arise from dominant electric as well as magnetic-
dipole transitions.
[1] J. D. Gillaspy, Phys. Scr. T 71, 99 (1997).
[2] Blagojević et al., Rev. Sci. Instrum. 76, 083102 (2005).
*NIST award #70NANB23H123 and NSF award 2309274
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