Bulletin of the American Physical Society
55th Annual Meeting of the APS Division of Atomic, Molecular and Optical Physics
Monday–Friday, June 3–7, 2024; Fort Worth, Texas
Session G10: High Harmonic Generation
10:30 AM–12:30 PM,
Wednesday, June 5, 2024
Room: 204AB
Chair: Mette Gaarde, Louisiana State University
Abstract: G10.00002 : Extracting correlation length in Mott insulators by strong-field driving*
11:00 AM–11:12 AM
Presenter:
Abdallah AlShafey
(The Ohio State University)
Authors:
Abdallah AlShafey
(The Ohio State University)
Xu-Yan Jia
(Beihang University)
Yuan-Ming Lu
(The Ohio State University)
Shou-Shu Gong
(Great Bay University)
Gerard McCaul
(Tulane University)
Denys I Bondar
(Tulane University)
Mohit Randeria
(Ohio State University)
Takashi Oka
(Institute for solid state physics, The University of Tokyo)
Alexandra S Landsman
(Ohio State University)
We found that interfacial coupling of a metal to the Mott insulator enhances high harmonic production inside the insulator and suggested an increase in the doublon-hole correlation length as the physical mechanism behind this lowered threshold for dielectric break-down. Here, we present an approach for extracting the doublon-hole correlation length of a Mott insulator to verify this hypothesis. The method is based on a dynamical calculation of the Mott insulator's rate of charge production in response to an applied strong-field laser pulse. We find that the correlation length does in fact increase drastically with increased interfacial coupling, in support of our hypothesis, which signifies the metal's role in the enhancement of charge fluctuations in the insulator.
We confirm our conclusions using Density Matrix Renormalization Group (DMRG) calculations. The proposed method further allows one to experimentally access the doublon-hole correlation length through measurable observables, such as differential reflectivity or the high harmonic generation (HHG) spectrum.
*This work was supported by the Center for Emergent Materials, an NSF MRSEC, under Grant No. DMR-2011876.
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