Bulletin of the American Physical Society
51st Annual Meeting of the APS Division of Atomic, Molecular and Optical Physics
Volume 65, Number 4
Monday–Friday, June 1–5, 2020; Portland, Oregon
Session K01: Poster Session II
4:00 PM,
Wednesday, June 3, 2020
Room: Exhibit Hall E
Abstract: K01.00014 : X-ray spectroscopy of highly ionized atoms using Transition Edge Sensor (TES) microcalorimeters at the NIST EBIT
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Authors:
Joseph Tan
(National Institute of Standards and Technology (NIST))
P. Szypryt
(NIST)
G.C. O'Neil
(NIST)
E. Takacs
(Clemson University)
S.W. Buechele
(Clemson University)
A.S. Naing
(University of Delaware)
D. A. Bennet
(NIST)
W.B. Doriese
(NIST)
M. Durkin
(NIST)
J.W. Fowler
(NIST)
J.D. Gard
(University of Colorado)
G.C. Hilton
(NIST)
K.M. Morgan
(NIST)
C.D. Reintsema
(NIST)
D.R. Schmidt
(NIST)
D.S. Swetz
(NIST)
J.N. Ullom
(NIST)
Yu. Ralchenko
(NIST)
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