Progress towards a second-generation eEDM measurement using trapped molecular ions

Our current uncertainty budget in the first-generation measurement of the electron's electric dipole moment (eEDM) is dominated by statistical uncertainty [1]. Our second-generation apparatus will leverage larger ion number, longer measurement coherence times, and increased quantum efficiencies to gain an order of magnitude improvement in statistical sensitivity. The second-generation experiment consists of 1) a larger ion trapping volume, increasing the number of ions available to contribute to the eEDM signal; 2) improved uniformity of trapping and rotating bias electric fields, leading to a colder ion cloud and to fewer decohering ion-ion collisions; and 3) a larger rotating bias electric field, resulting in a direct increase in measurement coherence time. We will present progress on the new system and on the expected increase in statistical sensitivity.\\ \\[4pt] [1] W. B. Cairncross \textit{et al.}, in preparation.