Bulletin of the American Physical Society
43rd Annual Meeting of the APS Division of Atomic, Molecular and Optical Physics
Volume 57, Number 5
Monday–Friday, June 4–8, 2012; Orange County, California
Session D1: Poster Session I (4:00 pm - 6:00 pm)
4:00 PM,
Tuesday, June 5, 2012
Room: Royal Ballroom
Abstract ID: BAPS.2012.DAMOP.D1.155
Abstract: D1.00155 : Evaluation of the Sensitivity Limits of Chip-scale Atomic Magnetometers
Preview Abstract Abstract
Authors:
Jiayan Dai
(University of Colorado at Boulder and National Institute of Standards and Technology)
Rahul Mhaskar
(National Institute of Standards and Technology)
Ethan Pratt
(National Institute of Standards and Technology)
W. Clark Griffith
(National Institute of Standards and Technology)
Amber Post
(National Institute of Standards and Technology)
Svenja Knappe
(National Institute of Standards and Technology)
John Kitching
(National Institute of Standards and Technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2012.DAMOP.D1.155
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