Session C31: Exhibitor Workshop: Nanomechanical Characterization Using PinPointTM for Atomic Force Microscopy Applications

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Why use PinPointTM Nanomechanical mode? PinPointTM is an advance imaging mode developed by Park Systems, that acquires high-resolution topography and F/D data at each pixel of the entire scan area. With PinPointTM mode, quantitative nanomechanical properties (i.e., modulus, adhesion, topography) can be obtained all at once. This presentation will cover PinPoint’sTM operation principle and the acquisition of nanomechanical properties through this method will be demonstrated using a Park Systems NX10 AFM.