First Deployment of an Electron Beam Ion Trap at an Advanced Source of Hard X-rays

We have deployed an Electron Beam Ion Trap (EBIT) at the Advanced Photon Source. The EBIT was cooled to 4K with a cryocooler and mounted on stepper motors to allow precise adjustment relative to the x-ray beam. The electron and x-ray beams crossed at a right angle in the horizontal plane. Spectra of photons emitted off-axis from the incident beams were recorded as Kr26+ and Ar8+ ions were subjected to x-rays up to 18 keV. No heating or other adverse effects on the operation of the cryogenic ion trap were experienced. Spectra and lessons learned for future work will be presented.