Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Abstract: C1.00155 : Modeling of charged particles trajectories in order to optimize the design of a new, higher resolution, Time of flight- Positron Annihilation Induced Auger Electron Spectroscopy (TOF PAES) System
Author:
Time of Flight Positron Annihilation Induced~Auger Electron
Spectroscopy~(TOF PAES) is a surface analytical technique with
high surface
selectivity. TOF PAES is used to study elemental composition,
surface
defects, and various energy loss mechanisms. Positrons incident
on the
sample surface at low energies can be trapped in an
image-potential well
just above the surface Prior to annihilation. Consequently it is
possible to
use positron annihilation related signals to selectively probe
the top-most
atomic layer. This poster presents the results of modeling of the
charge
particle beam transport system performed in connection with the
optimization
of the the design of the new TOF-PAES system currently under
construction at
U T Arlington. The system will incorporate a 2 m long drift tube
in order to
achieve better energy resolution than our previous TOF-PAES
system design
which used a 1 m long drift tube
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.C1.155
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