Bulletin of the American Physical Society
APS March Meeting 2011
Volume 56, Number 1
Monday–Friday, March 21–25, 2011; Dallas, Texas
Abstract: C1.00154 : Diamagnetic Levitation Cantilever System for the Calibration of Normal Force Atomic Force Microscopy Measurements
Author:
In this presentation we report a novel technique for normal force
calibration for Atomic Force Microcopy (AFM) adhesion
measurements known as
the diamagnetic normal force calibration (D-NFC) system. The
levitation
produced by the repulsion between a diamagnetic graphite sheet
and a set of
rare-earth magnets is used in order to produce an oscillation due
to an
unstable mechanical moment produced by a silicon cantilever
supported on the
graphite. The measurement of the natural frequency of this
oscillation
allows for the calculation of the stiffness of the system to
three-digit
accuracy. The D-NFC response was proven to have a high
sensitivity for the
structure of water molecules collected on its surface. This in
turns allows
for the study of the effects of coatings on the structure of
surface water.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2011.MAR.C1.154
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