2008 APS March Meeting
Volume 53, Number 2
Monday–Friday, March 10–14, 2008;
New Orleans, Louisiana
Session Q36: Focus Session: Advances in Scanned Probe Microscopy III: Force Methods
11:15 AM–2:15 PM,
Wednesday, March 12, 2008
Morial Convention Center
Room: 228
Sponsoring
Unit:
GIMS
Chair: Eric Hudson, IBM
Abstract ID: BAPS.2008.MAR.Q36.1
Abstract: Q36.00001 : Three-Dimensional Force Imaging and Quantification with Atomic Resolution
11:15 AM–11:51 AM
Preview Abstract
Abstract
Author:
Udo D. Schwarz
(Department of Mechanical Engineering, Yale University)
Atomic resolution images in noncontact atomic force microscopy (NC-AFM)
reflect planes of constant frequency shift. To draw conclusions on the
chemical activity at specific surface sites, however, the force acting
between tip and sample should be known locally rather than the frequency
shift. This is not an easy translation due to the non-linear nature of the
relationship between the two.
To overcome this problem, several groups have developed an extension to
NC-AFM, \textit{dynamic force spectroscopy}, which allows the precise, distance-dependent measurement of
tip-sample forces. The forces are determined from frequency shift versus
distance curves by mathematical analysis. Even though this approach had some
success, prior attempts resulted either only in two-dimensional atomic
resolution force \textit{xz}-maps or in data sets of relatively low resolution, as
long-term drift stability has been a problem.
Using our recently completed home-built low temperature, ultrahigh vacuum
NC-AFM, we were able to map the complete three-dimensional (3D) force field
over a surface. Simultaneously, the tip-sample interaction potential and the
energy dissipation of the oscillation process were recorded. As a test
material, we used highly oriented pyrolytic graphite (HOPG) in order to
study the atomic-scale origins of its qualities as a solid lubricant.
Individual data points have been acquired over a surface area comprising
several unit cells in a 3D grid with less than 6 pm grid size in all
directions. From this data set, representations of cuts in any direction can
be produced. While constant height images show atomic resolution with pN
force resolution, vertical cuts visualize how the attractive force fields of
the atoms extend into the vacuum space. We expect that the technique will
find applications in fields of science where a local knowledge of
interaction forces is beneficial, such as catalysis, chemical imaging, thin
film growth, device fabrication, and tribology.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.Q36.1