Bulletin of the American Physical Society
APS March Meeting 2021
Volume 66, Number 1
Monday–Friday, March 15–19, 2021; Virtual; Time Zone: Central Daylight Time, USA
Session E02: Developments in Reflectivity for Thin Film Characterization
8:00 AM–10:36 AM,
Tuesday, March 16, 2021
Sponsoring
Units:
DPOLY DBIO DSOFT
Chair: Daniel Sunday, National Institute of Standards and Technology
Abstract: E02.00003 : Characterization of anisotropic organic layered films by resonant soft x-ray reflectivity
8:48 AM–9:00 AM
Live
Presenter:
Luca Pasquali
(University of Modena & Reggio Emilia)
Authors:
Luca Pasquali
(University of Modena & Reggio Emilia)
Raffaella Capelli
(University of Modena & Reggio Emilia)
Matteo Bonfatti
(University of Modena & Reggio Emilia)
Francesco Mezzadri
(University of Modena & Reggio Emilia)
Emanuele Galligani
(University of Modena & Reggio Emilia)
Adriano Verna
(University of Roma Tre)
Alessandro Ruocco
(University of Roma Tre)
Nicola Mahne
(CNR-IOM)
Stefano Nannarone
(CNR-IOM)
Our recent advances in the application of resonant soft X-ray reflectivity will be presented. In particular, we developed a protocol to get simultaneous quantitative information on the structure, interface morphology, chemical properties and optical anisotropies of layered organic materials with sub-nm depth resolution. The method is based on the quantitative prediction of the spectral line-shape across specific elemental edges. The calculated reflectivity, obtained by simulating the propagation of the electromagnetic field in a stack of layers, each described by a dielectric tensor derived from first principles calculations, is compared and fitted to the experiment.
The method has been successfully applied by us to study anisotropic thin and ultrathin organic films on metals and insulators.
In particular, the case of anisotropic growth of Cu-phthalocyanine films (up to 40 nm) on Au(110) will be presented.
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