Bulletin of the American Physical Society
APS March Meeting 2020
Volume 65, Number 1
Monday–Friday, March 2–6, 2020; Denver, Colorado
Session F65: Defects and Dopants in Bulk Materials II
8:00 AM–11:00 AM,
Tuesday, March 3, 2020
Room: Mile High Ballroom 4F
Sponsoring
Unit:
DMP
Chair: Jinkyoung Yoo
Abstract: F65.00012 : Tracking interfacial disorder in SiGe qubit material*
Presenter:
Luis Fabian Pena
(Sandia National Laboratories)
Authors:
Luis Fabian Pena
(Sandia National Laboratories)
Justin C Koepke
(Sandia National Laboratories)
Ezra Bussmann
(Sandia National Laboratories)
*This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE’s National Nuclear Security Administration under contract DE-NA-0003525. The views expressed in the article do not necessarily represent the views of the U.S. DOE or U.S. Government.
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