Bulletin of the American Physical Society
APS March Meeting 2017
Volume 62, Number 4
Monday–Friday, March 13–17, 2017; New Orleans, Louisiana
Session A28: Dopants and Defects in Semiconductors I: Quantum Information
8:00 AM–11:00 AM,
Monday, March 13, 2017
Room: 291
Sponsoring
Units:
DMP FIAP DCOMP GQI
Chair: Paul Koenraad, Eindhoven University of Technology
Abstract ID: BAPS.2017.MAR.A28.5
Abstract: A28.00005 : A Well-Defined STM Image Resulting From Current-Induced Defect Fluctuations: The Butterfly On Si(001):H and Ge(001):H*
9:12 AM–9:24 AM
Preview Abstract Abstract
Authors:
Daniel Sanchez-Portal
(Centro de Fisica de Materiales CSIC-UPV/EHU and DIPC)
Mads Engelund
(Centro de Fisica de Materiales CSIC-UPV/EHU and DIPC)
Thomas Frederiksen
(DIPC and IKERBASQUE, Basque Foundation for Science, Bilbao, Spain)
Szymon Godlewski
(Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Jagiellonian Univ., Krakow, Poland)
Marek Kolmer
(Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Jagiellonian Univ., Krakow, Poland)
Rafal Zuzak
(Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Jagiellonian Univ., Krakow, Poland)
Bartosz Such
(Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Jagiellonian Univ., Krakow, Poland)
Marek Szymonski
(Centre for Nanometer-Scale Science and Advanced Materials (NANOSAM), Jagiellonian Univ., Krakow, Poland)
*FP7-FET-ICT PAMS (contract 610446), 2014/15/D/ST3/02975, MAT2013-46593-C6-2-P, IT-756-13
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAR.A28.5
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