Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session L7: Dopants and Defects in Semiconductors: Novel experimental techniques
11:15 AM–2:15 PM,
Wednesday, March 16, 2016
Room: 303
Sponsoring
Units:
DMP FIAP
Chair: James Speck, University of California, Santa Barbara
Abstract ID: BAPS.2016.MAR.L7.5
Abstract: L7.00005 : Second-Harmonic Generation scanning microscopy of strain fields around Through-Silicon-Vias
12:27 PM–12:39 PM
Preview Abstract Abstract
Authors:
Yujin Cho
(Univ of Texas, Austin)
Farbod Shafiei
(Univ of Texas, Austin)
Bernardo Mendoza
(Centro de Investigaciones en Optica, Leon, Mexico)
Tengfei Jiang
(Univ of Texas, Austin)
Paul Ho
(Univ of Texas, Austin)
Michael Downer
(Univ of Texas, Austin)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.L7.5
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