Bulletin of the American Physical Society
APS March Meeting 2016
Volume 61, Number 2
Monday–Friday, March 14–18, 2016; Baltimore, Maryland
Session K7: Dopants and Defects in Semiconductors: Nitrides
8:00 AM–11:00 AM,
Wednesday, March 16, 2016
Room: 303
Sponsoring
Units:
DMP FIAP
Chair: Christopher Van de Walle, UCSB
Abstract ID: BAPS.2016.MAR.K7.2
Abstract: K7.00002 : Impact of defects on efficiency of nitride devices*
8:36 AM–9:12 AM
Preview Abstract Abstract
Author:
Chris Van de Walle
(Univ of California - Santa Barbara)
*Work performed in collaboration with A. Alkauskas, C. Dreyer, A. Janotti, J. Lyons, D. Wickramaratne, J. Shen, and Q. Yan, and supported by DOE and NSF.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.MAR.K7.2
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