Bulletin of the American Physical Society
5th Joint Meeting of the APS Division of Nuclear Physics and the Physical Society of Japan
Volume 63, Number 12
Tuesday–Saturday, October 23–27, 2018; Waikoloa, Hawaii
Session EM: Nuclear Structure A=6-20 Part II
7:00 PM–9:30 PM,
Thursday, October 25, 2018
Hilton
Room: Queen's 6
Chair: Frederic Sarazin, Colorado School of Mines
Abstract ID: BAPS.2018.HAW.EM.4
Abstract: EM.00004 : Precision half-life measurement of 18N
7:45 PM–8:00 PM
Presenter:
Shun Iimura
(Dept. of Phys., Osaka Univ.)
Authors:
Shun Iimura
(Dept. of Phys., Osaka Univ.)
Miki Fukutome
(Dept. of Phys., Osaka Univ.)
Mariko Hisamatsu
(Dept. of Phys., Osaka Univ.)
Hajime Umehara
(Dept. of Phys., Osaka Univ.)
Shinnosuke Kanaya
(Dept. of Phys., Osaka Univ.)
Hiroki Nishibata
(RIKEN Nishina Center)
Atsuko Odahara
(Dept. of Phys., Osaka Univ.)
Tadashi Shimoda
(Dept. of Phys., Osaka Univ.)
Takafumi Hara
(Dept. of Phys., Osaka Univ.)
Masaharu Kinoshita
(Dept. of Phys., Osaka Univ.)
Ryo Nakajima
(Dept. of Phys., Osaka Univ.)
Rei Shudo
(Dept. of Phys., Osaka Univ.)
Ryo Wakabayashi
(Dept. of Phys., Osaka Univ.)
In order to develop a method to determine the short half-life of nuclei , we performed an experiment for 18N produced by the 9Be+18O reaction with E(18O)=9.4 MeV/u at RCNP RI beam line of Osaka university.
The 18N beam with intensity of 〜1300 pps was implanted in a gold stopper. β-ray was detected by 5 plastic scintillators with efficiency of 〜80 %.
The 18N beam was pulsed with duration of beam ON time of 1.9 s and beam OFF time of 4.3 s, which was optimized to determine half-life with most high precision.
However, for high precision measurement, dead-time correction is indispensable, because dead-time changes significantly as the count rate changes drastically. Therefore, we developed a unique method of dead-time correction by measuring dead-time event by event with 40 MHz clock signals.
We successfully determined half-life of 622.8(6) ms for 18N by the careful analysis with correction of dead-time, and subtraction of back ground components.
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.HAW.EM.4
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