Bulletin of the American Physical Society
69th Annual Gaseous Electronics Conference
Volume 61, Number 9
Monday–Friday, October 10–14, 2016; Bochum, Germany
Session RR1: Electrical Diagnostics II
11:00 AM–12:30 PM,
Thursday, October 13, 2016
Room: 1
Chair: Alan Howling, Swiss Plasma Center
Abstract ID: BAPS.2016.GEC.RR1.3
Abstract: RR1.00003 : Accuracy of cutoff probe for measuring electron density: simulation and experiment
11:45 AM–12:00 PM
Preview Abstract Abstract
Authors:
Dae-Woong Kim
(Physics, Chungnam national university)
Shin-Jae You
(Physics, Chungnam national university)
Si-June Kim
(Physics, Chungnam national university)
Jang-Jae Lee
(Physics, Chungnam national university)
Jung-Hyung Kim
(Vacuum center, Korea research institute of standard and science)
Wang-Yuhl Oh
(Mechanical engineering, Korea advanced institute of science and technology)
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2016.GEC.RR1.3
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