| Saturday, October 23, 2010 10:00AM - 10:12AM
 
 
 |  | SM5.00001: Estimation of the background due to inelastically scattered photoemitted valance band electrons in Ag (100) using APECS S. Kalaskar, S.L. Hulbert, B.R. Bartynski, A.H. Weiss
 
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| Saturday, October 23, 2010 10:12AM - 10:24AM
 
 
 |  | SM5.00002: Magneto-Plastic Properties of Ion Beam Sputtered Thin Films on Nitinol Sheet Metal Amanda Gregory, Wilhelmus J. Geerts, Anup Bandyopadhyay
 
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| Saturday, October 23, 2010 10:24AM - 10:36AM
 
 
 |  | SM5.00003: Positron Annihilation Spectroscopy of High Performance Polymer Films under CO$_{2}$ Pressure C.A. Quarles, John R. Klaehn, Eric S. Peterson, Jagoda M. Urban-Klaehn
 
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| Saturday, October 23, 2010 10:36AM - 10:48AM
 
 
 |  | SM5.00004: Dependence of calixarene electron beam sensitivity and contrast on functionalization Gregory Spencer, Daniel Ralls, Anup Bandyopadhyay, Michael Blanda
 
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| Saturday, October 23, 2010 10:48AM - 11:00AM
 
 
 |  | SM5.00005: Background suppressed measurements of the Low Energy CVV Auger transitions in Cu and Ag(100) K. Shastry, S. Mukherjee Mukherjee, S. Kalaskar, S.L. Hulbert, B.R. Bartynski, A.H. Weiss
 
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| Saturday, October 23, 2010 11:00AM - 11:12AM
 
 
 |  | SM5.00006: Surface Reconstruction of TiO$_{2}$(001) Studied by STM and LEED N.-H. Yu, K.T. Park, Z. Liao, G. Li, X. He, J. Teng, J. Zhang, E.W. Plummer
 
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| Saturday, October 23, 2010 11:12AM - 11:24AM
 
 
 |  | SM5.00007: Theoretical aspects of studies of high coverage oxidation of the Cu(100) surface using low energy positrons N.G. Fazleev, W.B. Maddox
 
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| Saturday, October 23, 2010 11:24AM - 11:36AM
 
 
 |  | SM5.00008: Residual stress in zinc oxide thin films deposited by atomic layer deposition David Elam, Ramakrishna Kotha, Arturo Ayon, Andrey Chabanov
 
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| Saturday, October 23, 2010 11:36AM - 11:48AM
 
 
 |  | SM5.00009: The Design and Fabrication of Bismuth Hall Effect Biosensors Anthony Sigillito, Martin Rudolph, Vicki Soghomonian, J.J. Heremans
 
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| Saturday, October 23, 2010 11:48AM - 12:00PM
 
 
 |  | SM5.00010: Using Spectroscopic Ellipsometry to Distinguish Between Si and SiO2 Nanoparticles Justin Frasier, Gregory Spencer, Anup Bandyopadhyay, Wilhelmus Geerts
 
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| Saturday, October 23, 2010 12:00PM - 12:12PM
 
 
 |  | SM5.00011: Organization and assembly of microstructures using optical tweezers and in-situ two-photon polymerization Ninad Ingle, Samarendra Mohanty
 
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| Saturday, October 23, 2010 12:12PM - 12:24PM
 
 
 |  | SM5.00012: An NMR Examination of Synthetic Consolidated Porous Media and Natural Unconsolidated Porous Media Caleb Bahr, Ryan Patterson, Lorne Davis
 
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