Bulletin of the American Physical Society
2006 Texas Section of the APS Joint Fall Meeting
Thursday–Saturday, October 5–7, 2006; Arlington, Texas
Session FIAP1: Industrial and Applied Physics
1:30 PM–3:30 PM,
Friday, October 6, 2006
UT Arlington, University Center
Room: Guadalupe
Chair: Stefan Zollner, Freescale Semiconductor, Inc.
Abstract ID: BAPS.2006.TSF.FIAP1.6
Abstract: FIAP1.00006 : The Relationship between the DC Bias and Debye Length in a Complex (Dusty) Plasma*
2:30 PM–2:42 PM
Preview Abstract
Abstract 
Authors:
James Creel
Jie Kong
Truell Hyde
(Baylor University)
*National Science Foundation Research Experience for Undergraduates
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2006.TSF.FIAP1.6
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