Bulletin of the American Physical Society
22nd Biennial Conference of the APS Topical Group on Shock Compression of Condensed Matter
Volume 67, Number 8
Monday–Friday, July 11–15, 2022; Anaheim, California
Session F03: X-Ray Diagnostics
3:30 PM–5:00 PM,
Monday, July 11, 2022
Anaheim Marriott
Room: Platinum 1
Chair: Andrew Krygier, Lawrence Livermore National Laboratory
Abstract: F03.00005 : In-situ X-ray diffraction under shock loading: cristallographic study of Tin polymorphic transitions.
4:30 PM–4:45 PM
Presenter:
Camille Chauvin
(CEA, Gramat, BP 80200, 46500 Gramat, France)
Authors:
Camille Chauvin
(CEA, Gramat, BP 80200, 46500 Gramat, France)
David Palma de Barros
(CEA, Gramat, BP 80200, 46500 Gramat, France)
X-ray diffraction is a complementary technique to investigate the microstructure on shocked single crystals or polycrystalline materials. The continuous improvement of X-ray generation techniques has provided X-ray sources capable of generating intense short pulses to perform X-ray diffraction under shock loading. X-ray diffraction experiments were carried out two facilities to investigate the beta-gamma transition in Tin: At CEA Gramat using an X-Pinch generator and at the Advanced Photon Source at Argonne using a synchrotron beam. Shocks were generated by plate impact experiments on gas gun.
Similar diffraction patterns are obtained from single crystals below and above the transition to study the evolution of the cristallographic structure of Tin under shock loading with a specific configuration of Xray diffraction in reflexion geometry. A specific tool was designed and developped to analyse and simulate diffraction patterns. On this new experimental basis, some hypothesis could be proposed regarding the material dynamic behavior.
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