Bulletin of the American Physical Society
79th Annual Meeting of the APS Southeastern Section
Volume 57, Number 16
Wednesday–Saturday, November 14–17, 2012; Tallahassee, Florida
Session HA: Applied Physics II |
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Chair: Ed Kintzel, Western Kentucky University Room: DoubleTree Ballroom |
Friday, November 16, 2012 10:45AM - 11:15AM |
HA.00001: The Progress and Promise of Advanced LIGO Invited Speaker: Joe Betzwieser The three initial, and later enhanced, LIGO gravitational wave detectors in the Livingston, Louisiana and Hanford, Washington observatories collected over one year of triple coincidence data at or better than the initial LIGO design sensitivity during science runs from 2005 to 2010. Astrophysical population estimates placed the detection rate for the initial LIGO detectors at 1 every 10 years, so it was not surprising that these instruments did not make a detection. The Advanced LIGO interferometers have been designed to be a factor 10 more sensitive than the initial detectors, which will increases the volume searched by a factor of 1000. These upgrades are expected not only to provide that first, elusive detection, but we hope to also allow for routine detections, and thus to usher in an exciting age of gravitational wave astronomy. Installation of the Advanced LIGO interferometers began two years ago and it is now more than half complete. We will present an overview of the Advanced LIGO detectors, as well as the current status of the installation. We will also go over some of the exciting science that these detectors, combined with other next generation gravitational wave detectors around the world, hope to accomplish once completed. [Preview Abstract] |
Friday, November 16, 2012 11:15AM - 11:45AM |
HA.00002: High Resolution Dual Modality (Neutron and X-ray) Imaging of Granular Materials and Direct Numerical Simulations Invited Speaker: Dayakar Penumadu This presentation will summarize the ongoing research of Mr. Felix Kim (PhD student of Dr. Penumadu) on the high resolution neutron ($\sim$13.7 $\mu$m/voxel) and X-ray ($\sim$11.2 $\mu$m/voxel) tomography imaging of partially water saturated compacted sand specimens. Neutron imaging work was performed at Helmholtz Zentrum Berlin (HZB) in collaborations with Drs. Kardjilov and Manke. Two different particle grain morphologies (round and angular) were used. Partially saturated granular assembly is a three phase material consisting of solid phase (Silica: SiO2), gas phase (air), and liquid phase (water). Due to different attenuation characteristics of neutrons and X-rays to these three phases of interest, neutron and X-ray images provided unique but complementary information. While the water phase contrast is well identified with cold neutron images without using a contrast agent, the detailed structure of silica sand phase is much clearly shown in X-ray images due to low attenuation of air/water phases to X-rays. This presentation will provide a detailed description of neutron and X-ray tomography techniques employed. An automatic approach to register the dual modality image in the same coordinate is also demonstrated. Direct numerical simulation technique based on the realistic pore geometry obtained from X-ray tomography of dry sand specimen is also demonstrated. Pore morphology method was used to predict capillary water distribution and capillary pressure - saturation curve as an example. Neutron imaging shows promise for interesting and multi-disciplinary research and the planned VENUS imaging beam line at the Spallation Neutron Source at Oak Ridge National Laboratory and the existing thermal imaging beam line at NIST will also be introduced.\\[4pt] Dr. Penumadu would like to acknowledge the support of DTRA award A12-1068 for this ongoing research. [Preview Abstract] |
Friday, November 16, 2012 11:45AM - 12:15PM |
HA.00003: New capabilities in helium-ion microscopy for nanofabrication and microanalysis at the Center for Nanophase Materials Sciences Invited Speaker: Adam Rondinone Electron microscopy is a critical technique for all types of nanoscience and basic materials research. However, it is now evident that future imaging needs at the nanoscale cannot be advanced purely by electron-beam instrumentation because enhancing one parameter of instrument performance, for example the spatial resolution, inevitably degrades some other parameter of performance, such as the depth-of-field. Minimizing these problems by techniques such as aberration correction is routine but raises the complexity and hence the cost of such electron-beam instruments to extraordinary levels. The technical advantages of using helium ions rather than electrons are clear - the ultra-short wavelength of ions compared to that of electrons of the same energy permits high resolution and high depth-of-field to be achieved simultaneously and, because the penetration depth of ions is 30 to 50x shorter than that for electrons, ion images are richer in surface detail. The Center for Nanophase Materials Sciences (CNMS) is commissioning the world's first helium-ion microscope tailored specifically for nanofabrication, to include imaging, FIB nanopatterning using helium/neon beams, and TOF-SIMS microanalysis. This instrument will be part of the user program and available to the general research community, and located within the CNMS cleanroom to accommodate fabrication and analysis of nanostructured devices within a clean environment. [Preview Abstract] |
Friday, November 16, 2012 12:15PM - 12:45PM |
HA.00004: Three-dimensional in situ nano manipulation and nano fabrication inside the scanning electron microscope Invited Speaker: Robert W. Cohn Beyond visualization and composition analysis, scanning electron microscopes (SEMs) provide limitless opportunities to probe, manipulate and fabricate materials and devices in real-time. Using a field emission electron microscope outfitted with a four arm nanomanipulator and numerous vacuum feedthroughs, a number of experiments and studies will be described, including bending and vibration mechanics of nanowires and polymer fibers, e-beam induced deflection and rotation of polymer nanofibers, selective growth of individual metallic nanowires from a room temperature alloy melt, field emission induced melting of sharpened tungsten tips and contact angle measurements of vacuum oils on nanowires. [Preview Abstract] |
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