Bulletin of the American Physical Society
2018 Annual Fall Meeting of the APS Ohio-Region Section
Volume 63, Number 15
Friday–Saturday, September 28–29, 2018; University of Toledo, Toledo, Ohio
Session A04: Condensed Matter Physics II
1:30 PM–3:00 PM,
Friday, September 28, 2018
SU
Room: 2592
Chair: Scott Medling, The University of Toledo
Abstract ID: BAPS.2018.OSF.A04.2
Abstract: A04.00002 : Morphological transitions and stacking fault dislocation in Cu islands grown on strained Cu(100)*
1:45 PM–2:00 PM
Presenter:
Ehsan Sabbar
(Univ of Toledo)
Authors:
Ehsan Sabbar
(Univ of Toledo)
Indiras Khatri
(Univ of Toledo)
Yunsic Shim
(Univ of Toledo)
Jacques Amar
(Univ of Toledo)
A variety of experiments on submonolayer heteroepitaxial growth have demonstrated that the combined effects of strain and bonding can lead to shape transitions as well as dislocation formation. In order to separate out the effects of strain from “chemical” effects, we have used temperature-accelerated dynamics simulations to study a simple model system corresponding to the growth of Cu on a strained Cu(100) substrate. In the case of 2% compressive strain we find that - as previously found for Cu/Ni(100) growth [1] - multi-atom “pop-out” events are enhanced, leading to the formation of blobby islands with a mixture of open and closed step-edges. However, for much larger (4%) compressive strain, we find that island formation leads to the formation of dislocations. In contrast, dislocation formation does not occur in the absence of deposition. Finally, we find that - in good agreement with recent theoretical results [2] - a very large (8%) tensile strain leads to the formation of large anisotropic islands. The dependence of the barriers for monomer hopping and exchange on strain will also be discussed.
[1] Y. Shim and J.G. Amar, Phys. Rev. Lett. 108, 076102 (2012).
[2] J.G. Amar, Y. Shim, and R.T. Deck, Surf. Sci. 616, 120 (2013).
*Supported by NSF DMR-1410840
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2018.OSF.A04.2
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