Bulletin of the American Physical Society
New England Section Fall 2023 Meeting
Friday–Saturday, October 20–21, 2023; University of Rhode Island, Kingston, Rhode Island
Session H01: Poster Session
9:40 AM,
Saturday, October 21, 2023
University of Rhode Island
Room: Engineering Fascitelli Center Hallway
Abstract: H01.00001 : Room temperature resistance measurements of metallic thin films using microwave cavities
Presenter:
Peter van Vlaanderen
(Yale University)
Author:
Peter van Vlaanderen
(Yale University)
Still, before using these materials within a qubit, it is necessary to characterize the film parameters. The kinetic inductance of a type-I superconductor can be calculated from its sheet resistance; however, traditional I - V measurements should be avoided because contact from the probe can damage the fragile surface of the thin film. This project therefore explores the precision of contactless resistance measurements that can be achieved using microwave cavities. The insertion of a sample into a cavity will introduce new losses, therefore making it possible to extract the resistance of the sample from the change in the quality factor of the cavity. These losses are simulated using finite element analysis software and show that sufficient precision can be obtained.
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