Bulletin of the American Physical Society
2017 Fall Meeting of the APS New England Section
Volume 62, Number 15
Friday–Saturday, October 20–21, 2017; Kingston, Rhode Island
Session G1: Physics, industry, and electronic materials at NIST NSLS beamlines |
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Saturday, October 21, 2017 11:15AM - 12:15PM |
G1.00001: Physics, industry, and electronic materials at NIST NSLS beamlines Invited Speaker: Joseph Woicik ``NIST's mission is to promote U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology in ways that enhance economic security and improve our quality of life.'' In this lecture I will discuss three industrial collaborations that highlight this paradigm: Local-structure determination in strained-layer semiconductors, ferroelectric strontium-titanate thin films on silicon, and hard x-ray photoelectron-spectroscopy measurements of semiconductor gate stacks. A common theme to each is the strain engineering of atomic and electronic structure and synchrotron measurement science. [Preview Abstract] |
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