Bulletin of the American Physical Society
2017 Annual Meeting of the APS Mid-Atlantic Section
Volume 62, Number 19
Friday–Sunday, November 3–5, 2017; Newark, New Jersey
Session H4: Optics-II
2:00 PM–3:36 PM,
Saturday, November 4, 2017
Room: 225, Campus Center, NJIT
Chair: Bart Kahr, New York University
Abstract ID: BAPS.2017.MAS.H4.4
Abstract: H4.00004 : Doppler variance analysis for high sensitivity morphological OCT imaging*
3:24 PM–3:36 PM
Preview Abstract
Abstract
Authors:
Farzana Zaki
(New Jersey Institute of Technology, Department of Electrical and Computer Engineering)
Dylan Renaud
(New Jersey Institute of Technology, Department of Physics)
Benjamin Litvin
(New Jersey Institute of Technology, Department of Electrical and Computer Engineering)
Nishat Sadia
(New Jersey Institute of Technology, Department of Electrical and Computer Engineering)
Jamia Gilles
(New Jersey Institute of Technology, Department of Electrical and Computer Engineering)
Xuan Liu
(New Jersey Institute of Technology, Department of Electrical and Computer Engineering)
*NIH Grant 1R15CA213092
To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2017.MAS.H4.4
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