Bulletin of the American Physical Society
2024 APS March Meeting
Monday–Friday, March 4–8, 2024; Minneapolis & Virtual
Session Y15: Josephson Junction Stacks and Diodes
8:00 AM–11:00 AM,
Friday, March 8, 2024
Room: M100F
Sponsoring
Unit:
DCMP
Chair: Christopher Parzyck, Cornell University
Abstract: Y15.00003 : Terahertz emission from stacked intrinsic Josephson junction Bi2Sr2CaCu2O8 sources: (θ, φ) angle-dependence of the emission power*
8:24 AM–8:36 AM
Presenter:
Sarah Elghazoly
(Queens College, City University of New York)
Authors:
Timothy M Benseman
(Queens College, City University of New York)
Sarah Elghazoly
(Queens College, City University of New York)
Karen J Kihlstrom
(Physical Sciences Incorporated)
Alexei E Koshelev
(Argonne National Laboratory)
Ulrich Welp
(Argonne National Laboratory)
Wai-Kwong Kwok
(Argonne National Laboratory)
Kazuo Kadowaki
(Algae Biomass and Energy System (ABES) Research & Development Center, University of Tsukuba)
Bi2Sr2CaCu2O8 THz sources have usually been investigated at emission frequencies ranging from 0.3 THz to 1.0 THz, corresponding to free space wavelengths ranging from 900 microns to 300 microns. Since these free space wavelengths are comparable to the dimensions of the stack of Josephson junctions, the far-field THz power radiated by the device is relatively smoothly distributed over 2π steradians of available solid angle.
For a large rectangular stack of optimally-doped Bi2Sr2CaCu2O8 Josephson junctions, we have studied the angular distribution of the emitted THz power in (θ, φ)-space, where θ is the poloidal angle with respect to the crystalline c-axis, and φ is the azimuthal angle (i.e. within the plane of the CuO2 layers). We find that different cavity modes excited within the stack result in very different (θ, φ)-distributions of the emitted THz power. We also find that the total integrated THz power for these modes ranges from tens of microwatts to a few hundred microwatts for this device. Our results provide direct confirmation of estimates for the emitted THz power from stacked Bi2Sr2CaCu2O8 sources that have been previously reported in the literature.
*This work was supported by the National Science Foundation under Grant No. 2045957. THz spectroscopy studies performed at Argonne National Laboratory were supported by the US Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. Microlithography work at the Argonne Center for Nanoscale Materials, an Office of Science user facility, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. We also acknowledge funding from PSC-CUNY grant 63771-00-51, and from the Japanese Society for the Promotion of Science under Grant No. 19H02540.
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