Tuesday, March 5, 2024
3:00PM - 3:12PM
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K25.00001: Solving the spatial distributions of multicomponent polymer thin films with resonant soft x-ray scattering
Julia Murphy, Kristof Toth, Daniel F Sunday, Eliot H Gann, Dean M DeLongchamp
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Tuesday, March 5, 2024
3:12PM - 3:24PM
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K25.00002: Quantifying Ion Distribution Profiles in Block Copolymers via Resonant Soft X-ray Scattering
Priyanka M Ketkar, Daniel F Sunday, Eliot H Gann, R. Joseph Kline, Dean M DeLongchamp
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Tuesday, March 5, 2024
3:24PM - 3:36PM
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K25.00003: Label-free characterization of aqueous micelle nanostructures via novel liquid in-situ Resonant Soft X-ray Scattering (RSoXS)
Devin Grabner, Phillip D Pickett, Terry McAfee, Brian A Collins, Charles L McCormick
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Tuesday, March 5, 2024
3:36PM - 3:48PM
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K25.00004: Depth-dependent orientation in thin films of bottlebrush block copolymers
Zhan Chen, Xindi Li, Mingqiu Hu, Xuchen Gan, Yashodha Kahandawaarachchi, Hong-Gyu Seong, Todd S Emrick, William T Heller, Javid Rzayev, Thomas P Russell
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Tuesday, March 5, 2024
3:48PM - 4:00PM
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K25.00005: Single-Molecule Dynamics of Confined Branched Polymers
Louis Wang, Danielle J Mai
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Tuesday, March 5, 2024
4:00PM - 4:12PM
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K25.00006: Nanoparticle Diffusion Coefficients at Liquid Interfaces Measured by SEM Single Particle Tracking
David Hoagland, Zachary Fink, Paul Y Kim, Satyam Srivastava, Alexander E Ribbe, Thomas P Russell
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Tuesday, March 5, 2024
4:12PM - 4:24PM
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K25.00007: Depth-Dependent Local Shear Modulus Profile Attained from Analyzing QCM Data with a New Transfer-Matrix Model Across a Polymer-Polymer Interface
Alexander A Couturier, Justin C Burton, Connie B Roth
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Tuesday, March 5, 2024
4:24PM - 5:00PM
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K25.00008: Resonant Tender X-ray Scattering of Semiconducting Polymers
Invited Speaker:
Christopher McNeill
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Tuesday, March 5, 2024
5:00PM - 5:12PM
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K25.00009: Polarized resonant soft X-ray scattering for organic photovoltaics
Dean M DeLongchamp
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Tuesday, March 5, 2024
5:12PM - 5:24PM
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K25.00010: Combing DFT based optical models with resonant X-ray reflectivity to measure orientation at buried interfaces
Harlan Heilman, Fred Woodall, Brian A Collins
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Tuesday, March 5, 2024
5:24PM - 5:36PM
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K25.00011: In situ X-ray tools for characterising vacuum thermally evaporated small molecules for use in organic photovoltaics
Olivia M Gough, Moritz K Riede, Zhenlong Li, Gregory Su, Pascal Kaienburg
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Tuesday, March 5, 2024
5:36PM - 5:48PM
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K25.00012: Hybrid Unified Analysis of Hierarchical Scattering
Greg Beaucage
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Tuesday, March 5, 2024
5:48PM - 6:00PM
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K25.00013: Quantitative X‐ray scattering and reflectivity measurements of polymer thin films with 2D detectors
Mingqiu Hu, Xuchen Gan, Zhan Chen, Hong‐Gyu Seong, Todd S Emrick, Thomas P Russell
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