Bulletin of the American Physical Society
APS March Meeting 2023
Volume 68, Number 3
Las Vegas, Nevada (March 5-10)
Virtual (March 20-22); Time Zone: Pacific Time
Session N42: 2D Materials: Advanced Characterization III
11:30 AM–2:18 PM,
Wednesday, March 8, 2023
Room: Room 318
Sponsoring
Unit:
DMP
Chair: Sujitra Pookpanratana, National Institute of Standards and Tech
Abstract: N42.00004 : Angle-dependent identification of twisted bilayer graphene using multi-spectral ellipsometric contrast microscopy
12:30 PM–12:42 PM
Presenter:
Jack Alexander-Webber
(University of Cambridge)
Authors:
Teja Potocnik
(University of Cambridge)
Oliver Burton
(University of Cambridge)
Stephan Hofmann
(Univ of Cambridge)
Jack Alexander-Webber
(University of Cambridge)
Spectroscopic imaging ellipsometry has emerged as a tool to determine the optical constants of graphene and provide thickness information with single-atomic layer precision with a lateral resolution down to 1 μm. Alternatively, polariser settings can be optimised for material and thickness contrast and fixed during imaging in ellipsometric contrast microscopy (ECM). Here we extend the technique to multi-spectral ECM (MS-ECM) demonstrated on chemical vapour deposited graphene on Si/SiO2. We show MS-ECM provides layer number sensitivity and wavelength dependent contrast of optically resonant bilayer regions. We generate a detailed map of the twist angle variation of bilayer graphene which is used to build a spatially correlated multi-characterisation technique dataset.
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