Bulletin of the American Physical Society
APS March Meeting 2023
Volume 68, Number 3
Las Vegas, Nevada (March 5-10)
Virtual (March 20-22); Time Zone: Pacific Time
Session M27: Superconductivity:JJ-II
8:00 AM–11:00 AM,
Wednesday, March 8, 2023
Room: Room 219
Sponsoring
Unit:
DCMP
Chair: Timothy Benseman, Queens College, City University of New York
Abstract: M27.00005 : Cavity mode dependence of terahertz emission power from stacked intrinsic Josephson junction Bi2Sr2CaCu2O8 sources*
8:48 AM–9:00 AM
Presenter:
Timothy M Benseman
(Queens College, City University of New York)
Authors:
Timothy M Benseman
(Queens College, City University of New York)
Sarah Elghazoly
(Queens College, City University of New York)
Karen J Kihlstrom
(Physical Sciences Incorporated)
Alexei E Koshelev
(Argonne National Laboratory)
Ulrich Welp
(Argonne National Laboratory)
Wai-Kwong Kwok
(Argonne National Laboratory)
Kazuo Kadowaki
(University of Tsukuba)
Bi2Sr2CaCu2O8 THz sources have been most typically studied at emission frequencies ranging from 0.3 THz to 1.0 THz, corresponding to free space wavelengths ranging from approximately 900 microns to 300 microns. Since the emission wavelength is comparable to or larger than the dimensions of the stack of Josephson junctions, the far-field THz power radiated by the device is broadly distributed over 2π steradians of solid angle.
For a large rectangular stack of optimally-doped Bi2Sr2CaCu2O8 Josephson junctions, we have mapped the angular distribution of the emitted THz power in (θ, φ)-space. We find that the (θ, φ)-dependence of the emitted THz power depends strongly upon which THz-frequency cavity mode is being excited within the stack. We also find that the total integrated THz power for these modes ranges from tens of microwatts to a few hundred microwatts for this device. Our results provide direct confirmation of estimates for the emitted THz power from stacked Bi2Sr2CaCu2O8 sources that have been previously reported in the literature.
*THz detection and spectroscopy studies performed at Argonne National Laboratory were supported by the US Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division. Microlithography work at the Argonne Center for Nanoscale Materials, an Office of Science user facility, was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357. This work was also supported by the National Science Foundation under Grant No. 2045957. We would also like to acknowledge funding from PSC-CUNY grants TRADB-47-573 and TRADB-48-476, and from the Japanese Society for the Promotion of Science under Grant No. 19H02540.
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