Bulletin of the American Physical Society
APS March Meeting 2022
Volume 67, Number 3
Monday–Friday, March 14–18, 2022; Chicago
Session W12: Optical/Laser and High Frequency Devices and Applications Including Optoelectronics and Photonics
3:00 PM–5:36 PM,
Thursday, March 17, 2022
Room: McCormick Place W-181C
Sponsoring
Unit:
FIAP
Chair: Curt Richter, National Institute of Standards and Tech
Abstract: W12.00004 : Impact ionization-induced bistability in cryogenic CMOS transistors for capacitorless memory applications
3:36 PM–3:48 PM
Presenter:
Curt A Richter
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA)
Authors:
Curt A Richter
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA)
Alexander Zaslavsky
(School of Engineering, Brown University, Providence, RI USA)
Pragya R Shrestha
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA and Theiss Research, La Jolla, CA USA)
Brian Hoskins
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA)
Son T Le
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA and Theiss Research, La Jolla, CA USA)
Advait Madhavan
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA and University of Maryland, College Park, MD USA)
Jabez J McClelland
(Nanoscale Device Characterization Division, National Institute of Standards and Technology, Gaithersburg, MD USA)
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