Bulletin of the American Physical Society
APS March Meeting 2022
Volume 67, Number 3
Monday–Friday, March 14–18, 2022; Chicago
Session T00: Poster Session III (1pm- 4pm CST)
1:00 PM,
Thursday, March 17, 2022
Room: McCormick Place Exhibit Hall F1
Abstract: T00.00097 : Charge accumulation driven by pseudo-hydrodynamics of quasiparticles in a semimetal WTe2 at room temperature*
Presenter:
Young-Gwan Choi
(Department of Energy Science, Sungkyunkwan University)
Authors:
Young-Gwan Choi
(Department of Energy Science, Sungkyunkwan University)
Manh-Ha Doan
(Department of Physics, Technical University of Denmark)
Maxim Chernodub
(CNRS, Institut Denis Poisson, Universities of Tours and Orleans)
Gyung-Min Choi
(Department of Energy Science, Sungkyunkwan University)
We directly image similar charge-alternating accumulation patterns in WTe2 in the semimetallic phase at room temperature by adopting a polarization-sensitive laser microscopy method with an electrical bias. The spatial charge distribution shows extremely long relaxation length, ~1.4 μm, which are much more extended than a charge screening length in conventional semimetals (usually nanometer scales). We analyze that the phenomena are originated from the long recombination time of electron-hole pairs in this nearly-compensated Weyl semimetal.
We theoretically suggest that these exotic charge accumulation behaviors appear due to the unbalanced diffusive flow of electron-hole currents. Our analytical calculations show that the Ohmic electric current can produce pseudo-hydrodynamic whirlpool structures in the charge neutral current. We argue that it is the backflow of a neutral current which leads to the exotic alternating charge distribution near the contacts. Moreover, the fluid-like behavior of the quasiparticle can be described in terms of a modified Navier-Stokes equation equipped with higher-derivative terms.
*G.-M. C. acknowledges the National Research Foundation of Korea (NRF) grant funded by the Korea government (NRF-2019R1C1C1009199, 2018M3D1A1058793). M.-H. D. acknowledges the NRF (NRF-2019R1I1A1A01063236). H. C. acknowledges the NRF (NRF- 2019R1A2C3006189).
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