Bulletin of the American Physical Society
APS March Meeting 2022
Volume 67, Number 3
Monday–Friday, March 14–18, 2022; Chicago
Session T00: Poster Session III (1pm- 4pm CST)
1:00 PM,
Thursday, March 17, 2022
Room: McCormick Place Exhibit Hall F1
Abstract: T00.00277 : Increasing Photovoltaic Conversion Efficiency in GaAs/Si Tandem Solar Cells through Nano-BondingTM and Surface Energy Engineering*
Presenter:
Nimith Gurijala
(Arizona State University Dpt of Physics)
Authors:
Nimith Gurijala
(Arizona State University Dpt of Physics)
Pranav Penmatcha
(Arizona State University Dpt of Physics)
Siddu Jandhyala
(Arizona State University Dpt of Physics)
Ajay Taduri
(Arizona State University Dpt of Physics)
Aashi R Gurijala
(Arizona State University Dpt of Physics)
Amber A Chow
(Arizona State University Dpt of Physics)
Shaurya Khanna
(Arizona State University Dpt of Physics)
Michelle Bertram
(Arizona State University Dpt of Physics)
Christian Cornejo
(Arizona State University Dpt of Physics)
Timoteo Diaz
(Arizona State University Dpt of Physics)
Wesley Peng
(Arizona State University Dpt of Physics)
Thilina Balasooriya
(Arizona State University Dpt of Physics)
Mohammed Sahal
(Arizona State University Dpt of Physics)
Dr. Robert J Culbertson
(Arizona State University Dpt of Physics)
Dr. Karen L Kavanaugh
(Simon Fraser University)
Dr. Nicole Herbots
(Arizona State University Dpt of Physics)
Collaboration:
SiO2 Innovates, Arizona State University
Nano-BondingTM (NB) via Surface Energy Engineering (SEE) lowers processing T< 220°C. SEE can reverse hydro-affinity, planarizes surfaces at the nano-, micro – and macro-scale and forms far-from-equilibrium 2D Precursor Phases (2D-PP) to cross-bond GaAs to Si via electron exchange. Three Liquid Contact Angle Analysis (3LCAA) measures HA via 3 liquids with different dipole moments, Ion Beam Analysis (IBA) measures oxygen coverage by combining <111> ion channeling with nuclear resonance, and X-Ray Photoelectron Spectroscopy (XPS) characterizes 2D-PPs. Surface Acoustic Wave Microscopy (SAM) and Transmission Electron Microscopy (TEM) image nano-bonded GaAs/Si interface.
3LCAA shows SEE can double the surface energy of GaAs from 30.4 to 60.2 mJ/m2 . IBA finds SEE decreases by 50% oxygen coverage on GaAs from 7.2 ± 0.5 to 3.6 ± 0.2 ML. XPS reveals that As2O5 is decreased by 13.5%, while As2O5 increases by 13.5%. After SEE, SAM shows that 98±1% of GaAs bonds to Si at T≤ 220°C.
*Supported by SiO2 Innovates, AccuAngle Analytics, and National Sciences and Engineering Research Council of Canada.
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