Bulletin of the American Physical Society
APS March Meeting 2022
Volume 67, Number 3
Monday–Friday, March 14–18, 2022; Chicago
Session T00: Poster Session III (1pm- 4pm CST)
Thursday, March 17, 2022
Room: McCormick Place Exhibit Hall F1
Abstract: T00.00014 : Characterization of Thicknesses of Multi-Layered Thin Films Based on Recursive Calculations of Refraction at Layers' Interfaces*
Additionally, we develop a method based on Total Color Difference (TCD) that can precisely determine the thicknesses of substrates that achieve optimal visibility of thin films in the visible range. A method of predicting the color of a sample of a fixed thickness through values of reflectance is also developed and agrees with experimental observation.
*This work was partly supported by the NSF Grant DMR 1709781 and the Graduate Student Summer Research Grant from the Fisher College of Science and Mathematics at Towson University.
The American Physical Society (APS) is a non-profit membership organization working to advance the knowledge of physics.
1 Physics Ellipse, College Park, MD 20740-3844
Editorial Office 1 Research Road, Ridge, NY 11961-2701 (631) 591-4000
Office of Public Affairs 529 14th St NW, Suite 1050, Washington, D.C. 20045-2001 (202) 662-8700