| Wednesday, March 16, 2022 3:00PM - 3:36PM
 
 
 |  | Q31.00001: New Approaches to Atomic-Resolution Structural Analysis by Analytical Scanning Transmission Electron Microscopy Invited Speaker: 
Robert F Klie
 
 
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| Wednesday, March 16, 2022 3:36PM - 3:48PM
 
 
 |  | Q31.00002: Scanning Transmission Electron Microscopy based Atomic Scale Fabrication Enhanced by In-operando Optical and Thermal Excitation Stephen Jesse, Ondrej Dyck, Andrew R Lupini
 
 
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| Wednesday, March 16, 2022 3:48PM - 4:00PM
 
 
 |  | Q31.00003: Mapping conductivity with secondary electron EBIC in a STEM Ondrej Dyck, Jacob Swett, Charalambos Evangeli, Andrew R Lupini, Jan Mol, Stephen Jesse
 
 
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| Wednesday, March 16, 2022 4:00PM - 4:12PM
 
 
 |  | Q31.00004: Enhancing Symmetry Breaking Defects in Materials with a STEM Phase Plate Stephanie M Ribet, Colin L Ophus, Vinayak P Dravid, Roberto dos Reis
 
 
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| Wednesday, March 16, 2022 4:12PM - 4:24PM
 
 
 |  | Q31.00005: Kinetic and thermodynamic measurements of the crystallization of phase change materials using transmission electron microscopy and nanocalorimetry Isak McGieson
 
 
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| Wednesday, March 16, 2022 4:24PM - 4:36PM
 
 
 |  | Q31.00006: Atomic scale direct-write dopant patterning on graphene Andrew R Lupini, Ondrej Dyck, Mina Yoon, Sergei V Kalinin, Jacob Swett, Stephen Jesse
 
 
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| Wednesday, March 16, 2022 4:36PM - 4:48PM
 
 
 |  | Q31.00007: Terahertz microspectroscopy: far-field spectral fidelity degradation and recovery Tim LaFave, Andrea G Markelz
 
 
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| Wednesday, March 16, 2022 4:48PM - 5:00PM
 
 
 |  | Q31.00008: Traceable localization in optical microscopy Craig R Copeland, Ronald G Dixson, Andrew C Madison, Adam L Pintar, B. Rob Ilic, Samuel M Stavis
 
 
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| Wednesday, March 16, 2022 5:00PM - 5:12PM
 
 
 |  | Q31.00009: Rapid simulations of hyperspectral near-field images of three-dimensional heterogeneous surfaces Xinzhong Chen, Ziheng Yao, Stefan G Stanciu, Dmitri N Basov, Rainer Hillenbrand, Mengkun Liu
 
 
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| Wednesday, March 16, 2022 5:12PM - 5:24PM
 
 
 |  | Q31.00010: Development of Image Corrections for Photoemission Electron Microscopy (PEEM) and its Application to Graphene Henry Bell, Falk Niefind, Randolph E Elmquist, Sujitra Pookpanratana
 
 
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| Wednesday, March 16, 2022 5:24PM - 5:36PM
 
 
 |  | Q31.00011: Reconstruction of Nano-Plasmonic Excitations Using Ultrafast Transmission Electron Microscopy John H Gaida, Hugo Lourenço-Martins, Sergey Yalunin, Armin Feist, Murat Sivis, Thorsten Hohage, F. Javier García de Abajo, Claus Ropers
 
 
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| Wednesday, March 16, 2022 5:36PM - 5:48PM
 
 
 |  | Q31.00012: A scanning NV center magnetometry probe fabricated by a focused ion beam Yuta Kainuma, Aoi Ideguchi, Kunitaka Hayashi, Toshu An
 
 
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