Wednesday, March 16, 2022
11:30AM - 11:42AM
|
|
N31.00001: UHV Compatible Negative Stiffness Vibrational Isolator for STM
Arnav Srivastava, Wan-Ting Liao, Jennifer Hoffman
|
Wednesday, March 16, 2022
11:42AM - 11:54AM
|
|
N31.00002: Adding RF capabilities to a mK-STM for capacitance measurements
Michael Dreyer, Jonathan J Marbey, Robert E Butera
|
Wednesday, March 16, 2022
11:54AM - 12:06PM
|
|
N31.00003: Resolving nanoscale mechanical properties of multi-layered low-k dielectric films by contact resonance atomic force microscopy
Gheorghe Stan, Sean W King
|
Wednesday, March 16, 2022
12:06PM - 12:18PM
|
|
N31.00004: Characterizing Charged Defects in Oxide-on-Silicon using Kelvin Probe Force Microscopy
Leah Tom, Zachary J Krebs, Justin T White, Wyatt A Behn, Mark A Eriksson, Victor W Brar, Sue N Coppersmith, Mark G Friesen
|
Wednesday, March 16, 2022
12:18PM - 12:30PM
|
|
N31.00005: Using functionalized tips mounted on noncontact atomic force microscope to break chemical bonds within molecules – a computational perspective
Dingxin Fan, James R Chelikowsky
|
Wednesday, March 16, 2022
12:30PM - 12:42PM
|
|
N31.00006: Scanning Probe Microscopy Combined with Low Temperature Cryogen-free Operation in an Ultra-High Vacuum High Field Environment
Angela M Coe, Guohong Li, Eva Y Andrei
|
Wednesday, March 16, 2022
12:42PM - 12:54PM
|
|
N31.00007: Scattering-Type Scanning Near-Field Optical Microscopy with Akiyama Piezo-Probes
Michael Dapolito, Xinzhong Chen, Chaoran Li, Makoto Tsuneto, Shuai Zhang, Xu Du, Adrian Gozar, Mengkun Liu
|
Wednesday, March 16, 2022
12:54PM - 1:06PM
|
|
N31.00008: Advanced numerical modeling of light-matter interactions at nanometer length scales
Haoyue Jiang, Patrick McArdle, David J Lahneman, Mumtaz Qazilbash, Tetiana Slusar, Hyun-Tak Kim, Amlan Biswas, Jingyi Chen
|
Wednesday, March 16, 2022
1:06PM - 1:18PM
|
|
N31.00009: Compensation of electrostatically-induced background in s-SNOM.
Artem Danilov
|
Wednesday, March 16, 2022
1:18PM - 1:30PM
|
|
N31.00010: Modifying plasmon resonances at nanocavities by molecular adsorption: A Scanning Tunnelling Microscopy Study
Óscar Jover Arrate, Koen Lauwaet, Roberto Otero
|
Wednesday, March 16, 2022
1:30PM - 1:42PM
|
|
N31.00011: Scanning Gradiometry of Magnetic and Electric Fields with a Single Nitrogen-Vacancy Sensor
William S Huxter, Marius L Palm, Miranda L Davis, Christian L Degen
|