films integrated on silicon (001)

Integrating ferroelectric materials onto Si is a critical part of the design new photonic devices such as optical modulators and switches. One property used to make optical modulators is the electro-optic effect. Most work in electro-optic modulators is directly related to analyzing the devices themselves, whereas less work has been doing on investigating the properties of the thin films. Here, we analyze thick BTO films integrated on Si via multiple experimental techniques and compare with modelling to study their crystalline properties as a function of thickness. We use this to more carefully analyze electro-optic measurements of BTO on Si. This work can be used to compliment and improve the BTO integrated electro-optic device making process.