Design and Evolution of Atomic Force Microscopy

Since its invention and first commercialization, the atomic force microscope AFM has become an essential tool for imaging, measuring, and manipulating matter at the nanoscale. When compared to the early scanning probes systems employed decades ago, modern AFM instruments have undergone drastic improvements to their essential components and control software. New scanning methods and accessories have enabled correlated AFM measurements of various properties beyond basic surface topography. The latest AFM trends are not only limited to advancing technical performance, but also focus on improving AFM user experience for widespread adoption in numerous industrial and academic research environments. This workshop will review 1) the basic principles of AFM, 2) current AFM design and applications, and 3) the future of artificial intelligence, automation, and robotics in atomic force microscopy.